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Scanning electron microscope and related equipment

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Kính hiển vi điện tử quét phát xạ trường ion Argon NTI-ArFIB 200 Kính hiển vi điện tử quét phát xạ trường ion Argon NTI-ArFIB 200

The Dual Beam (DB) system typically refers to a combination of a Scanning Electron Microscope (SEM) + Focused Ion Beam (FIB).

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NTI-FE 2800 - Kính hiển vi điện tử quét phát xạ trường NTI-FE 2800 - Kính hiển vi điện tử quét phát xạ trường

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NTI-FE 1801- Field Emission Scanning Electron Microscope NTI-FE 1801- Field Emission Scanning Electron Microscope

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