Sistem Pengukuran Ellipse

Gambaran Keseluruhan Produk

Berdasarkan modulasi pemampas putaran berganda, pengukuran pantas 16 elemen keseluruhan matriks Muller direalisasikan

Ia digunakan untuk pencirian ketebalan filem nipis isotropik/anisotropik, pemalar optik, dan struktur nano.

Teknologi teras

Teknologi kawalan segerak pemampas putaran dwi
Teknologi pemampas akromatik spektrum luas,
Teknologi pengesanan bintik rendah Algoritma penentukuran ketepatan instrumen
Perubahan sudut automatik sepenuhnya dan teknologi fokus, pengukuran pantas satu kunci
Permukaan buah mesin manusia interaktif Wizard, pengalaman operasi perisian yang mudah
Pangkalan data bahan yang banyak dan perpustakaan model algoritma, keupayaan analisis data yang kuat

Technical Characteristics

Mueller Matrix Ellipsomemeter

Based on the modulation of double rotation compensators,

the fast measurement of 16 elements of the whole Muller matrix is realized

It is used for the characterization of isotropic/anisotropic thin film film thickness, optical constants, and nanostructures.

High-Precision Spectroscopic Ellipsometer

It can realize scientific research/enterprise-level high-precision and rapid spectral ellipsometry measurement, support multi-angle, low-spot and other high-compatibility flexible configuration, multi-function module customized design, and is widely used in optical communication/OLED/TP/transparent conductive film and other applications involving transparent substrate coating measurement and characterization