Ellipse Measurement System

Product Overview

Based on the modulation of double rotation compensators, the fast measurement of 16 elements of the whole Muller matrix is realized

It is used for the characterization of isotropic/anisotropic thin film film thickness, optical constants, and nanostructures

Core technology

Dual rotation compensator synchronous control technology
Wide spectrum achromatic compensator technology,
Low-speckle detection technology Instrument precision calibration algorithm
Fully automatic angle change and focus technology, one-key fast measurement
Wizard interactive man-machine fruit surface, convenient software operation experience
Abundant material database and algorithm model library, strong data analysis capabilities

Technical Characteristics

Mueller Matrix Ellipsomemeter

Based on the modulation of double rotation compensators,

the fast measurement of 16 elements of the whole Muller matrix is realized

It is used for the characterization of isotropic/anisotropic thin film film thickness, optical constants, and nanostructures.

High-Precision Spectroscopic Ellipsometer

It can realize scientific research/enterprise-level high-precision and rapid spectral ellipsometry measurement, support multi-angle, low-spot and other high-compatibility flexible configuration, multi-function module customized design, and is widely used in optical communication/OLED/TP/transparent conductive film and other applications involving transparent substrate coating measurement and characterization