Atomic Force Microscope Nano Observer Xl - Hong Kong NTI (HK

MIKROSKOP KUASA ATOM Nano-Observer XL

Lagi AFM

Gambaran Keseluruhan Produk

Satu-satunya AFM untuk menjawab semua aplikasi anda Daripada pengukuran elektrik kepada mekanikal dan melalui persekitaran yang berbeza, Nano-Observer XL ialah AFM yang anda perlukan!

Maklumat Asas

• HD-KFMTM

• RESISCOPETM

• Soft ResiScope

• Soft IC (mechanical, electrical, SThM...)

• Kawalan alam sekitar

• SUHU EZ dari -40° hingga 300°C

• Cecair EZ (cecair, EC...)

• Kemudahan penggunaan

Kualiti Pengukuran

3 langkah untuk pengukuran AFM yang berkualiti dan resolusi tinggi!

Pengesanan optik

Bunyi rendah (kualiti pengesanan) dan koheren rendah (untuk mengelakkan campur tangan laser/ sampel) laser.

Elektronik

Elektronik hingar rendah (pengawal, kualiti bekalan kuasa) dan resolusi kawalan imbasan (24 bit) untuk ketepatan pada sebarang saiz imbasan.

Peringkat lentur yang dipatenkan

Peringkat kami membenarkan imbasan 100µm XY (dan 15µm Z) daripada tahap atom atau resolusi molekul MOD RESONANT 250NM SCAN

Quick and Easy Control

Intuitive Software

The pre-configured modes makes it possible to select simply

the AFM mode. With a single click, you can switch between all AFM modes. No more additional need, no more mistakes

or damage.

Top/Side Views

A video color camera offer a helpful view from the top for tip/

sample positioning or side view to make the tip/sample approach easier. High performance optic : A high performance optic (option) is also available to localize small features on without replacing the scanner !

Advanced Electrical Modes

Resiscope combined with HD-KFM & sMIM = the best AFM electrical measurements package !

ResiScope

• The best tool for AFM electrical characterization

• Current/ Resistance from 10² to 10 12 ohms

• Current control

• High sensitivity over the full range

• ResiScope mode, resistance signal,

• vanadium dioxide (VO2), 15µm

HD-KFM

• Optimized single-pass KFM

• One pass - NO LIFT

• Very high sensitivity

• Higher spatial resolution

sMIM

• Scanning microwave impedance microscopy

• Nanoscale permittivity & conductivity mapping

• Capacitance/ permittivity

• Resistivity/ conductivity variations

Applications

Semiconductors

Stair case » sample showing clear different doping concentration (each step is about 400nm). No cross talk with topography and very clean and define electrical measurement !

Molecular electronic, Organic Photovoltaic.

Example on a very thin OPV sample. A normal conductive AFM was burning the layer. Due to its sensitivity with a lower current. The ResiScope is the unique able to image such OPV samples