Scanning electron microscope and related equipment
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The Dual Beam (DB) system typically refers to a combination of a Scanning Electron Microscope (SEM) + Focused Ion Beam (FIB).
The NTI-FE 2800 is a high-performance Field Emission Scanning Electron Microscope (FE-SEM) designed for high-resolution surface imaging and nanoscale material characterization. It is widely used in semiconductor inspection, materials science research, nanotechnology, and microstructure analysis.
Field Emission Scanning Electron Microscope (FE-SEM) designed for high-resolution surface imaging and micro-nano structural analysis. Ideal for materials science, semiconductor inspection, nanotechnology research, and advanced laboratory characterization.
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