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Scanning electron microscope and related equipment

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NTI-ArFIB 200 Argon Ion Field Emission Scanning Electron Microscope NTI-ArFIB 200 Argon Ion Field Emission Scanning Electron Microscope

The Dual Beam (DB) system typically refers to a combination of a Scanning Electron Microscope (SEM) + Focused Ion Beam (FIB).

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NTI-FE 2800 - Field Emission Scanning Electron Microscope NTI-FE 2800 - Field Emission Scanning Electron Microscope

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NTI-FE 1801- Field Emission Scanning Electron Microscope NTI-FE 1801- Field Emission Scanning Electron Microscope

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