Field Emission Scanning Electron Microscope (FE-SEM)

Field Emission Scanning Electron Microscope (FE-SEM) designed for high-resolution surface imaging and micro-nano structural analysis. Ideal for materials science, semiconductor inspection, nanotechnology research, and advanced laboratory characterization.

Categories : Product , Products Fabs , Micro-nano Characterization , Scanning electron microscope and related equipment , Products Labs , Micro-nano Characterization , Scanning electron microscope and related equipment

Product Description

Specification

Product Overview

The NTI-FE 1801 scanning electron microscope (SEM) uses Schottky field emission gun (FEG) technology. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging performance at low accelerating voltages, enabling high-resolution imaging of various materials. Multiple detector systems efficiently collect diverse electron signals emitted from the sample for imaging, revealing microscopic morphology and structural information of the sample to the maximum extent

Basic Information