serves the on-wafer probing needs of the worldwide semiconductor

industry, the originator of the Picoprobe® line of microwave and oscilloscope probes

Microwave Testing

High Impedance Active Probes

MCW Probe Card

PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.

The probe points on a probe card can even be set to different depths so that multi-level modules can be successfully probed. Any pitch (tip spacing) from 50 to 1250 microns may be specified. Larger pitch probes are available by special order. The probes can be configured with Ground-Signal-Ground (G,S,G), Ground-Signal (G,S), or Signal-Ground (S,G) tip footprints.

Each probe card is carefully checked for planarity and with its individually spring loaded Beryllium-Copper tips, provides reliable contacts, even when probing non-planar structures. This reliable low resistance contact is one of the keys to providing highly repeatable measurements. Direct viewing of the probe tips ensures easy and accurate positioning.

Connection to the Model 40A is through a female K connector and is compatible with SMA and 3.5mm connectors. Connection to the Model 50A is through a female 2.4mm connector. Connection to the Model 67A is through a female V connector and is compatible with the 2.4mm connector. Connection to the Model 110H is through a female 1.0 mm connector.

Many different wiring configurations are available for the dc, power supply, or medium frequency needles. Ribbon cable, coaxial cable, and hook up wire are some of the types available. Our standard connectors include banana plugs, BNC connectors, SMA connectors, and (9, 15, 25, or 37) pin D-Subminiature connectors. Other connectors can be specified.

DC Disposable Probe Tips

HexAuFoil® ultra-small hole gold supports

Improve every image with these revolutionary new small hole, holey-gold supports that enable zero-dose reconstructions for the first time by delivering movement-free imaging. Our most advanced cryo-EM support for to maximise efficiency for high-resolution structure determination in drug discovery and basic research. The first pre-production batches are now available to order from SPT Labtech.

QUANTIFOIL® holey carbon film supports

QUANTIFOIL® perforated amorphous carbon support films for transmission electron microscopy have a uniform hole size, shape and spacing ideal for modern automated data collection. Suitable for a wide range of applications including SPA, tomography and CLEM, our carbon films can be applied to a wide range of grids, including finder grids and those with larger open viewing areas.

UltrAuFoil® holey gold supports

UltrAuFoil® ultra-stable gold supports allow better reconstructions from less data by reducing beam-induced motion. The ideal support for researchers wanting to maximise resolution and data quality for SPA, including those utilising high-throughput workflows required for structure-based drug discovery.

Additional UltraThin Carbon Layer (UTC)

Add an additional ultrathin continuous carbon layer (UTC) to improve particle distribution and quality. The carbon surface adsorbs biomolecules across the entire hole, both improving dispersion and maintaining quality by sequestering the particles away from the destructive air-water interface.

PROBE TIPS FOR SCANNING FORCE MICROSCOPY

We offer a wide variety of scanning force microscopy probe tips for imaging, metrology, and material characterization, to name only a few.

Beside our standard products, we develop and manufacture customer specific cantilevers and probe tips.

ASPIRE AFM PROBES

Aspire AFM probes are conically-shaped AFM tips for general purpose usage. Made of high quality single crystal silicon, the Aspire probes are robust and offer long imaging life. Probe geometry plays an important role when imaging surfaces. Uniform tip shapes guarantee the acquisition of symmetrical images.

PROBE TIP CHARACTERIZERS

For quantitative 3D AFM the precise tip shape of the AFM-probe needs to be known. For the characterization of probe tips we offer a variety of probe tip characterizers. A typical application example is scanning an I²PSR with a CDR-probe to determine the shape of the probe.

BEAM SHAPING APERTURES

Using MEMS technology we fabricate beam shaping apertures with well controlled profiles, extremely smooth sidewalls, very small corner radii and precise dimensions. Typically silicon, silicon nitride, metals or combinations of these and other materials are used to form the aperture.