Atomic Force Microscope
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Scanning Thermal Microscopy (SThM) enables nano-scale temperature mapping and thermal conductivity measurement using AFM technology. Ideal for semiconductor hotspot detection, nanoelectronics evaluation, and advanced materials research.
AFM Electrical Measurements Systems enable high-resolution electrical analysis including I-V spectroscopy, conductivity mapping, and nanoscale carrier transport studies. Ideal for semiconductor devices, nanoelectronics, and advanced materials research.
The AFM Galaxy Dual Controller delivers high-speed, high-precision control for atomic force microscopy systems. Designed for advanced nano-imaging, semiconductor research, and multi-module electrical and mechanical characterization.
The Nano-Observer AFM delivers reliable nano-scale imaging and surface analysis at an affordable cost. Ideal for universities, research laboratories, and materials science applications requiring high-quality AFM performance within budget.
The Nano-Observer XL AFM is designed for high-precision nano-scale surface analysis on large samples and wafers. Ideal for semiconductor fabrication, advanced materials research, and industrial R&D applications.
The Educational Scanning Microscope Probe is a user-friendly AFM platform designed for nanotechnology education. Ideal for universities, materials science laboratories, and STEM teaching environments.
The Educational Scanning Tunneling Microscope (FM-Nano View T-STM) enables atomic-scale imaging of conductive materials. Designed for nanotechnology education, surface physics labs, and university STEM programs.
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