In-situ
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The In-Situ TEM Four-Degree-of-Freedom Nanomanipulator is a high-precision nano positioning system designed for in-situ experiments inside Transmission Electron Microscopes (TEM). Ideal for materials science, nanotechnology, semiconductor research, and micro-nano characterization.
The In Situ AFM in SEM system integrates Atomic Force Microscopy within a Scanning Electron Microscope chamber, enabling simultaneous nano-scale topography and structural analysis. Ideal for semiconductor research, advanced materials science, and micro-nano device development.
In-Situ Heating Chips & Holders enable precise temperature-controlled experiments inside SEM and TEM chambers. Designed for real-time thermal characterization of advanced materials, semiconductors, battery research, nanotechnology, and micro-device reliability testing.
The Electron Microscope In-Situ Bias Heating System enables simultaneous electrical biasing and temperature-controlled experiments inside SEM or TEM chambers. Designed for semiconductor device testing, battery research, nanoelectronics, and advanced materials reliability analysis.
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