Optical Measurement (Micro1000/HUD/SV200)
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The Wafer Warpage Stress Gauge provides high-precision optical measurement of wafer warpage, bow, and thin-film stress. Designed for semiconductor fabs and R&D labs to monitor process-induced stress and ensure wafer flatness and quality.
The Wafer Internal Stress Tester SV200 provides high-precision measurement of internal wafer stress and thin-film stress for semiconductor manufacturing and research laboratories. Designed for optical stress analysis and process monitoring in advanced semiconductor fabs.
The HUD (Head-Up Display) Measurement System provides precision optical testing for automotive HUD displays. Designed to evaluate image brightness, distortion, alignment, and optical performance for display development, quality control, and R&D.
3D Measuring Microscope Micro1000 is designed for high-precision micro and nano surface analysis. The system enables accurate measurement of surface height, depth, roughness, and 3D structure, ideal for semiconductor, electronics, material science, and advanced research applications.
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