Electron Microscope In-Situ Bias Heating System for Electrical and Thermal Characterization

The Electron Microscope In-Situ Bias Heating System enables simultaneous electrical biasing and temperature-controlled experiments inside SEM or TEM chambers. Designed for semiconductor device testing, battery research, nanoelectronics, and advanced materials reliability analysis.

Categories : Product , Products Labs , Micro-nano Characterization , In-situ

Product Description

Specifications

Product Overview

Norcadas unique MEMS technology enabling E-Biasing chips for corelative In-Situ analysis in Electron and X-ray microscopes, and cross compatible with Norcada, Hitachi, and Mel-Build Heating and Biasing Holders.

The units are ideal for both AC and DC biasing, in 2-Probe and 4-Probe Configurations.

In-Situ Bias Heating Holder SEM Electrical Heating Stage TEM Bias & Heating System Nano Electrical Testing Platform In situ bias heating in SEM Electrical heating holder for TEM SEM electrical characterization system High temperature bias testing Nano device reliability testing

Electron Microscope In-Situ Bias Heating System for Electrical and Thermal Characterization

Related Products

Off-Line Confocal Micro Raman & Photoluminescence (PL) Spectroscopy System for QC, QA, Failure Analysis & R&D

In-Situ Heating Chips & Holders for SEM and TEM Thermal Characterization

In Situ AFM in SEM System for Advanced Micro and Nano Surface Characterization

Fully Automatic Pneumatic Nanoimprint System for Industrial Nano Fabrication