Electron Microscope In-Situ Bias Heating System for Electrical and Thermal Characterization

Short Description

The Electron Microscope In-Situ Bias Heating System enables simultaneous electrical biasing and temperature-controlled experiments inside SEM or TEM chambers. Designed for semiconductor device testing, battery research, nanoelectronics, and advanced materials reliability analysis.

Categories: Product, Products Labs, Micro-nano Characterization, In-situ

Product Description

Specifications

Product Overview

Norcadas unique MEMS technology enabling E-Biasing chips for corelative In-Situ analysis in Electron and X-ray microscopes, and cross compatible with Norcada, Hitachi, and Mel-Build Heating and Biasing Holders.

The units are ideal for both AC and DC biasing, in 2-Probe and 4-Probe Configurations.

In-Situ Bias Heating Holder SEM Electrical Heating Stage TEM Bias & Heating System Nano Electrical Testing Platform In situ bias heating in SEM Electrical heating holder for TEM SEM electrical characterization system High temperature bias testing Nano device reliability testing