NTI-FE 2800 Field Emission Scanning Electron Microscope System
The NTI-FE 2800 is a high-performance Field Emission Scanning Electron Microscope (FE-SEM) designed for high-resolution surface imaging and nanoscale material characterization. It is widely used in semiconductor inspection, materials science research, nanotechnology, and microstructure analysis.
Product Overview
The NTI-FE 2800 scanning electron microscope (SEM) has excellent low-voltage and high-resolution imaging capabilities, and is equipped with a thermal field emission electron gun (Schottky FEG) to obtain high resolution while ensuring the stability of the beam current. Advanced full-column accelerating technology integrated into the electron optical column ensures outstanding imaging perrormance at low accelerating voltages. The immersion magnetic-objective lens design furrher enhances the high-resolution imaging capability of the system. The optimized detection system can efficiently collect secondarr electron and backscattered electron signals at low voltage, which can directly observe non-conductive samples at low voltage, reduce the irradiation damage to the sample, and reveal the surfrace micromorphology and structure information
Basic Information
Application direction
Carbon nanotubes、Silicon-carbon anode materials、Electron beam exposure etching pattern、TiO2 nanosheets、Wet stretch film、Lithium iron phosphate positive electrode sheet、HfO2/SiC ceramic、Mouse cerebral corex tissues.
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