KLA related (Profilm3D/R50-4PP)

The Filmetrics® R50 is an advanced optical thin film measurement system designed for high-precision thickness analysis of thin films. It is widely used in semiconductor manufacturing, microelectronics, and material science for multi-layer film characterization and optical metrology.

The Profilm3D® Optical Profilometer is a high-precision optical surface profiling system designed for 3D topography measurement and surface roughness analysis. It is widely used in semiconductor manufacturing, microelectronics, and advanced materials research.