CG-0-4 High & Low Temperature Vacuum Probe Station for Semiconductor Characterization
CG-0-4 High & Low Temperature Vacuum Probe Station is designed for semiconductor wafer testing and electrical characterization under controlled vacuum and extreme temperature conditions. Ideal for micro-nano research, material studies, and advanced device analysis.
Product Overview
CG series high and low temperature vacuum probe station is the innovative achievement of SEMISHARE's technology accumulation over the years, and SEMISHARE is also the first high and low temperature vacuum probe station independently developed and launched in China, CG high and low temperature vacuum probe station can realize the accurate electrical, light intensity, wavelength, magnetic field and other tests of samples in a vacuum high and low temperature environment, and it plays a technical advantage in ultra-low temperature, ultra-high vacuum, automatic control, and laser simulation.
Application Direction
CG series high and low temperature vacuum probe station in high and low temperature vacuum environment chip test, LD/LED/PD test, fiber spectral characteristics test, material/device IV/CV characteristics test, Hall test, electromagnetic transport characteristics, high frequency characteristics test, etc
Basic Information
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