Nano-Observer XL (AFM)


Product Description

Product Overview

The only AFM to answer all your applications

From electrical to mechanical measurements andthrough different environments, the Nano-Observer XLis the AFM you need!

Basic Information

  • HD-KFMTM
  • RESISCOPETM
  • Soft ResiScope
  • Soft IC (mechanical,electrical, SThM...)
  • Environmental control
  • EZ TEMPerature from -40°  to 300°C
  • EZ Liquids (fluids, EC...)
  • Ease of use 

Advanced Modes

  • New : Soft IC, 3rd AFM mode
  • The advantages of contact and resonant
  • AFM modes without the drawbacks
  • Package of powerful electric modes: - sMIM- HD-KFM- ResiScope 
  • Different environments  : - Temperature (-40°C to 300°C) - Liquid measurements

Quality Of Measurements

3 steps for quality AFM and high resolution measurements !

Optical detection : Low noise (quality of detection) and low coherence (to prevent laser/ sample intereferences) laser.

Electronic : Low noise electronics (controller, quality of the power supplies) and resolution of the
scan control (24 bit) for accuracy at any scan size.

Patented flexure stage : Our stage allows from 100µm scan XY (and 15µm Z) from atomic
level or molecular resolution RESONANT MODE
250NM SCAN

Quick And Easy Control

Intuitive software : The pre-configured modes makes it possible to select simply the AFM mode. With a single click, you can switch between all AFM modes. No more additional need, no more mistakes or damage.

Top/ side views : A video color camera offer a helpful view from the top for tip/ sample positioning or side view to make the tip/sample approach easier. High performance optic : A high
performance optic (option) is also available to localize small features on without replacing the scanner !

Advanced Electrical Modes

Resiscope combined with HD-KFM & sMIM = the best AFM electrical measurements package !

ResiScope : The best tool for AFM electrical characterization Current/ Resistance from 10² to 10 12 ohms Current control High sensitivity over the full range

ResiScope mode, resistance signal, vanadium dioxide (VO2), 15µm

HD-KFM : Optimized single-pass KFM One pass - NO LIFT Very high sensitivity Higher spatial resolution

sMIM : Scanning microwave impedance microscopy Nanoscale permittivity & conductivity mapping Capacitance/ permittivity Resistivity/ conductivity variations


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