Product Overview
The only AFM to answer all your applications
From electrical to mechanical measurements andthrough different environments, the Nano-Observer XLis the AFM you need!
Basic Information
Advanced Modes
Quality Of Measurements
3 steps for quality AFM and high resolution measurements !
Optical detection : Low noise (quality of detection) and low coherence (to prevent laser/ sample intereferences) laser.
Electronic : Low noise electronics (controller, quality of the power supplies) and resolution of the
scan control (24 bit) for accuracy at any scan size.
Patented flexure stage : Our stage allows from 100µm scan XY (and 15µm Z) from atomic
level or molecular resolution RESONANT MODE
250NM SCAN
Quick And Easy Control
Intuitive software : The pre-configured modes makes it possible to select simply the AFM mode. With a single click, you can switch between all AFM modes. No more additional need, no more mistakes or damage.
Top/ side views : A video color camera offer a helpful view from the top for tip/ sample positioning or side view to make the tip/sample approach easier. High performance optic : A high
performance optic (option) is also available to localize small features on without replacing the scanner !
Advanced Electrical Modes
Resiscope combined with HD-KFM & sMIM = the best AFM electrical measurements package !
ResiScope : The best tool for AFM electrical characterization Current/ Resistance from 10² to 10 12 ohms Current control High sensitivity over the full range
ResiScope mode, resistance signal, vanadium dioxide (VO2), 15µm
HD-KFM : Optimized single-pass KFM One pass - NO LIFT Very high sensitivity Higher spatial resolution
sMIM : Scanning microwave impedance microscopy Nanoscale permittivity & conductivity mapping Capacitance/ permittivity Resistivity/ conductivity variations