SEM Consumables
Sample Stages
Product Name
Description
Pin Sample Stage
Compatible with FEI, TESCAN, and ZEISS SEM systems. Supports sample diameters of 6 / 6.6 / 8 / 9.6 / 12.7 / 18 / 25 / 25.4 / 32 / 38 / 50 / 100 mm.
Available in multiple angles: Pin straight, Pin 45°, Pin 70°, Pin 90° suitable for both small and large specimens.
Cylindrical Stage for JEOL
Designed specifically for JEOL SEMs.
Available diameters: 9.5 / 10 / 12.2 / 12.5 / 15 / 25 / 32 / 50 mm.
Provides firm mounting and smooth horizontal rotation.
Angle-Type Stage for JEOL
For JEOL SEMs, adjustable at 30°, 45°, 70°, and 90°.
Ideal for angled imaging or surface analysis.
Cylindrical Stage with M4 Thread (for Hitachi)
For Hitachi SEMs, equipped with M4 screw threads.
Available sizes: 15 / 25 / 32 / 35 / 50 mm.
Strong and heat-resistant construction.
Electron Filaments
Product Name
Description
Tungsten Filament
Provides high brightness, sharp imaging, and cost efficiency. Suitable for general SEM applications.
Lanthanum Hexaboride (LaB) Filament
Offers higher brightness and longer lifespan than tungsten. Ideal for high-resolution analytical work.
Preparation & Conductive Adhesives
Product Name
Description
Conductive Carbon Adhesive
Used to mount specimens on stages without interfering with electrical signals. Suitable for general use.
Conductive Silver Adhesive
Provides high electrical conductivity for precise sample connections.
Double-Sided Carbon Tape
Easy to use and adheres firmly suitable for small or irregularly shaped specimens.
Double-Sided Silver Tape
Offers stable electrical conductivity, suitable for research or precision testing applications.
Diamond Scribing Tools
Product Name
Description
Diamond Scribing Pen
Pen-shaped handle for cutting hard materials such as silicon, glass, and metal.
Diamond Knife
Ultra-sharp diamond blade for cutting samples into thin, smooth sections.
Replaceable Diamond Tip
Replaceable diamond head to extend tool life and reduce replacement cost.
Standard Calibration Samples
Product Name
Description
Magnification Calibration Sample
Used to mount specimens on stages without interfering with electrical signals. Suitable for general use.
X-ray Calibration Sample
For adjusting the response of internal X-ray detection systems.
Resolution Standard Sample
Used to verify SEM imaging resolution.
Backscattering Standard Sample
For testing and calibrating backscattered electron detectors.
EDS Standard Sample
Used to calibrate energy detection for EDS (Energy Dispersive Spectroscopy) systems.
Elemental Analysis Standard Sample
Serves as a reference for verifying elemental analysis accuracy.
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