M Series Basics Manual Probe Station

Product Overview

A Basics type designed specifically for university education and laboratory research, this "Basic Series" wafer prober is an essential tool for the semiconductor and optoelectronic industries. It is engineered for precision electrical measurement, making it ideal for R&D on complex high-speed devices, including chips, LD/LED/PD units, and packaging devices.

Basic Information

Application Direction

Semiconductor & Optoelectronics: R&D for chips, Laser Diodes (LD), LEDs, and Photodiodes (PD).
Component Testing: PCB and package device testing.
Electrical Characterization: RF testing, IV/CV characteristic analysis.
Compatibility: Suitable for electrode/pad testing on materials and components 50 microns.

Technical Characteristics

New upgraded chuck mobile platform

Enclosed mobile platform design, dustproof, error-proof operation, beautiful structure. The moving platform adopts THK precision lead screw drive + linear movement + no clearance return trip difference design + chuck locking function to improve chuck moving precision in many aspects.

Technical characteristics

New upgraded chuck mobile platform

Chuck with 3-stage vacuum adsorption control

The central vacuum adsorption hole and 3-ring vacuum adsorption ring are used to fix the sample. Each vacuum channel of the chuck can independently control the central adsorption hole of the standard chuck to be 1mm in diameter. The chuck Angle can be rotated 360 and the precision of micro-rotation can be adjusted to 0.002 according to the requirements of customers, which is convenient to adjust the position of the sample to be tested.

POMater^TM Adaptive shock absorbing base

The self-adaptive shock-absorbing base is designed with imported shock-absorbing materials from Germany to enhance elastic support, to achieve different degrees of rigidity, hardness and bearing range, and effectively filter vibration source interference in the environment to ensure stable contact between the probe end and the Pad of the sample, improving the stability of the test.