Afm - Hong Kong NTI

AFM accessories-Appnano-silion prober

AppNano develops, manufactures, and supplies various nanostructures including standard and specialized SPM probes that are compatible with all major AFM equipment in the market for most applications

We leverage our extensive experience in nanofabrication technology and research in SPM probes to supply the highest quality probes

Our in-house clean room facility combined with our state-of-the-art characterization tools enables rapid prototyping, adaptability, and versatility in designing and developing custom products

Major research programs are continuously underway both in-house and with external collaborators to develop high performance probes for advanced applications

ACCESS-C-10

k:0.3N/m;f:16kHz;Tip-view-Contact mode, Uncoated, Si probe;10/box

ACCESS-EFM-10

k:2.7N/m;f:60kHz; PtIr coated- Tip view- Force modulation EFM, Si probe;10/box

ACCESS-FM-GG-10

k:2.7N/m;f:60kHz; Au coated- Tip view- Tapping?/Non-contact EFM, Si probe;10/box

HYDRA2R-100NGG-10

k:0.011N/m;f:21kHz;Contact mode in liquid, Au on both sides- Si nitride cantilever with Si tip;10/box

HYDRA2R-100NGG-TL-10

k:0.011N/m;f:26kHz;Tipless- Custom applications in air, Au coated, Si nitride cantilever;10/box

ACL-10

k:58N/m;f:190.0kHz;TappingTM/Non-contact mode in air, Long lever-Uncoated, Si probe;10/box

ACLA-SS-10

k:58N/m;f:190kHz;Super sharp tip (1-2 nm)- Tapping?/Non-contact mode in air, Al on reflex side, Si probe;10/box

HART0-1-5

k:40N/m;f:300kHz;High aspect ratio tip- 1 渭m long spike- 0掳 tilt compensation, Uncoated, Si probe;5/box

STEP-OX-0.1

100nm,SiO2 Step Height Reference

STEP-OX-0.1-D

100nm,SiO2 Step Height Reference, mounted on Metal Disc

AIODLC-10

k值：0.2N/m(CB1) 、2.7N/m(CB2)、7.4N/m(CB3)、40N/m(CB4)，f值：15kHz(CB1)、80kHz(CB2)、150kHz(CB3)、350kHz(CB4),Coating: Hard Diamond-Like-Carbon ，AFM tip shape: Rotated，10/box

AIOAl-TL-10

k值：0.2N/m(CB1) 、2.7N/m(CB2)、7.4N/m(CB3)、40N/m(CB4)，f值：15kHz(CB1)、80kHz(CB2)、150kHz(CB3)、350kHz(CB4),Coating: Reflective Aluminum ，AFM tip shape: Tipless，10/box

AIO-DD-10

k值：0.5N/m(CB1) 、6.5N/m(CB2)、18N/m(CB3)、100N/m(CB4)，f值：19kHz(CB1)、110kHz(CB2)、200kHz(CB3)、450kHz(CB4),Coating: Conductive Diamond ，AFM tip shape: Rotated，10/box

Tap300E-G-10

k值：40N/m ，f值：300kHz,Coating: Electrically Conductive ，AFM tip shape: Rotated，10/box

Multi75E-G-10

k值：3N/m ，f值：75kHz,Coating: Electrically Conductive， AFM tip shape: Rotated，10/box

Tap190DLC-10

k值：48N/m ，f值：190kHz,Coating: Hard Diamond-Like-Carbon ，AFM tip shape: Rotated，10/box

Multi75DLC-10

k值：3N/m ，f值：75kHz,Coating: Hard Diamond-Like-Carbon ，AFM tip shape: Rotated，10/box

AIO-TL-10

k值：0.2N/m(CB1) 、2.7N/m(CB2)、7.4N/m(CB3)、40N/m(CB4)，f值：15kHz(CB1)、80kHz(CB2)、150kHz(CB3)、350kHz(CB4),Coating: none，AFM tip shape: Tipless，10/box

Tap190GD-G-50

k值：48N/m ，f值：190kHz,Coating: Reflective Gold ，AFM tip shape: Rotated，50/box

SHR150-5

k值：5N/m ，f值：150kHz,Coating: Reflective Gold ,AFM tip shape: Supersharp,5/box

ATEC-CONT-10

k: 0.2N/m; f: 15kHz; Contact Mode AFM Probe with REAL Tip Visibility; Coating: none; AFM tip shape: Visible; 10/box

ATEC-CONTAu-10

k: 0.2N/m; f: 15kHz; Gold Coated Contact Mode AFM Probe with REAL Tip Visibility; Coating: none; AFM tip shape: Visible; 10/box

ATEC-CONTPt-10

k: 0.2N/m; f: 15kHz; Electrical, Contact Mode AFM Probe with REAL Tip Visibility; Coating: Electrically Conductive; AFM tip shape: Visible; 10/box

ATEC-NCPt-10

k: 45N/m; f: 335kHz; Electrical, Tapping Mode AFM Probe with REAL Tip Visibility; Coating: Electrically Conductive; AFM tip shape: Visible; 10/box

ATEC-FM-10

k: 2.8N/m; f: 85kHz; Force Modulation AFM Probe with REAL Tip Visibility; Coating: none; AFM tip shape: Visible; 10/box

AR10-NCHR-10

k:42 N/m,f:320 kHz,Detector Side Coating:Reflex (Al),High Aspect Ratio Tip (10:1),10/box

AR5-NCH-10

k: 42N/m; f: 330kHz; High-Aspect-Ratio, Tapping Mode AFM Probe; Coating: none; AFM tip shape: High-Aspect-Ratio; 10/box

PtSi-CONT-10

k: 0.2N/m, f: 13kHz; Electrical, Contact Mode AFM Probes; Coating: Platinum Silicide Overall; AFM tip shape: Standard; 10/box

SSS-NCH-10

k:42 N/m,f:320 kHz,SuperSharpSilicon™ tip,10/box

Arrow™ CONT-10

k:0.2 N/m,f:14kHz,10/box

Arrow™ FM-10

k:2.8 N/m,f:75kHz,10/box

CONT-50

k:0.2 N/m,f:13 kHz,Standard tip shape,30/box

CONTSC-10

k:0.2 N/m,f:25 kHz,Short cantilever,10/box

ZEILR-10

k:1.6 N/m,f:27 kHz,Detector Side Coating:Reflex (Al),Standard tip shape,10/box

SEIHR-10

k:15N/m,f:130kHz,Detector Side Coating:Reflex (Al),Standard tip shape,10/box

CDT-FMR-10

k:6.2 N/m,f:105 kHz,Tip Side Coating：Conductive diamond，Detector Side Coating：Reflex (Al)，Conductive diamond coated tip,10/box

S-MFMR-10

k:2.8N/m,f:75kHz,Tip Side Coating:Soft magnetic, medium momentum,Detector Side Coating:Reflex (Al),Standard tip shape,10/box

PNP-DB-20

k值：0.48N/m（CB1)、 0.06 N/m (CB2)，f值：67 kHz（CB1）、17 kHz（CB2），Detector Side Coating：Reflex (Au)，Cantilever(s) Shape：Beam,20/box

USC-F5-k30-10

k:30N/m,f:5000kHz,Coating：Reflex (Au)，10/box

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